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IEEE Test Technology Educational Program 2018 
(TTEP'18)

April 22-25, 2018
Hyatt Centric Fisherman’s Wharf, San Francisco, CA, USA

(VTS'18) 

http://ttep.tttc-events.org/ttep/tutorials.html 

Early registration: April 10th, 2018.


VTS 2018 - CALL FOR TUTORIALS PARTICIPATION

Scope


IEEE VLSI Test Symposium 2018 (VTS'18) is offering 2 half-day TTEP tutorials for which a separate registration fee is required. Attendees who register for the tutorials may select either one or both of the offerings. All tutorials qualify for credit towards IEEE TTTC certification under the TTEP program. Attendees of tutorials receive study material, handouts, breakfast and coffee breaks. The study material includes copies of the presentation and bibliographical material, and, when applicable, a relevant textbook (textbooks are provided to attendees who register at IEEE/CS member or non-member rates).

You can find detailed information about the tutorials in the following link:

http://tttc-vts.org/public_html/new/2018/tutorials/

Registration


Register for the VTS'18 tutorials in the Registration Page  http://tttc-vts.org/public_html/new/2018/registration/

Program

April 22nd, 2018 (Sunday)

Morning Tutorial (8:30 - 12:00)

Machine Learning and Its Applications in Test

Presenters:

  • Yu Huang and Gaurav Vega, Mentor, A Siemens Business

In this tutorial, we will start by covering the basics of machine learning. We will proceed to give a brief overview of the new and exciting field of deep learning. We will show how easy it is to try using machine learning and deep learning, thanks to powerful, free libraries. After offering the required background in machine learning, we will review several important papers in the field of DFT, diagnosis, yield learning, and root cause analysis, which use machine learning algorithms for solving various problems. Finally, we will propose future research directions in the area of testing, where we think machine learning (especially deep learning) can make a big impact.


Afternoon Tutorial (1:00 p.m. - 4:30 p.m.)

Learning Techniques for Reliability Monitoring, Mitigation and Adaptation

Presenter:

  • Mehdi Tahoori, Karlsruhe Institute of Technology
With increasing the complexity of digital systems and the use of advanced nanoscale technology nodes, various process and runtime variabilities threaten the correct operation of these systems. The interdependence of these reliability detractors and their dependencies to circuit structure as well as running workloads makes it very hard to derive simple deterministic models to analyze and target them. As a result, machine learning techniques can be used to extract useful information which can be used to effectively monitor and improve the reliability of digital systems. These learning schemes are typically performed offline on large data sets in order to obtain various regression models which then are used during runtime operation to predict the health of the system and guide appropriate adaptation and countermeasure schemes.


Additional Information

TTEP General Chair

Paolo Bernardi
Politecnico di Torino, Italy
T: +39 011 564 7183
E: paolo.bernardi@polito.it

TTEP Program Chair

Ilia Polian
University of Passau, Gernany
T: +49 851 509 3040
E: ilia.polian@uni-passau.de

Committee

GENERAL CHAIR

  • P. BERNARDI -  Politecnico di Torino 

PROGRAM CHAIR

  • I. POLIAN -  University of Passau

PAST CHAIR

  • D. GIZOPOULOS – University of Athens

FINANCE CHAIR

  • C.-H. CHIANG – Alcatel-Lucent

PUBLICITY CHAIR

  • E. SANCHEZ – Politecnico di Torino

PLANNING CHAIR

  • Y. ZORIAN – Synopsis

ELECTRONIC MEDIA CHAIRS

  • S. DI CARLO – Politecnico di Torino
  • A. BOSIO – LIRMM 

ORGANIZING LIASONS

  • Y. ZORIAN - ITC'18
  • M. WOLF  - DATE'18
  • L. BOLZANI POEHLS - LATS'18
THECNICAL PROGRAM COMMITTEE
  • Magdy Abadir, Helic
  • John Carulli, GlobalFoundries 
  • Artur Jutman, Testonica
  • Rohit Kapur, Cadence 
  • Jochen Rivoir, Advantest 
  • Melanie Schillinsky, NXP 
  • Daniel Tille, Infineon 

 

For more information, visit us on the web at: http://ttep.tttc-events.org/ttep/tutorials.html 

The Test Technology Educational Program 2018 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC)


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR 
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

PAST CHAIR 
Michael NICOLAIDIS 
TIMA Laboratory - France 
Tel. +33-4-765-74696 
E-mail michael.nicolaidis@imag.fr

TTTC 1ST VICE CHAIR 
Matteo SONZA REORDA
Politecnico di Torino - ITALY
E-mail matteo.sonzareorda@polito.it

SECRETARY
Joan FIGUERAS
Un. Politec. de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

ITC GENERAL CHAIR 
Michael Purtell
Intersil 
- USA 
Tel. +1-408-372-6015 
E-mail m.purtell@ieee.org

TEST WEEK COORDINATOR
Yervant ZORIAN 
Synopsys, Inc.  USA 
Tel. +1-650-584-7120 
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Paolo BERNARDI
 
Politecnico di Torino
 - Italy
Tel. +39-011-564-7183
E-mail paolo.bernardi@polito.it

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES 
André IVANOV 
University of British Columbia - Canada 
Tel. +1-604-822-6936 
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA 
Giorgio DI NATALE
LIRMM - France
Tel. +33-467-41-85-01
E-mail giorgio.dinatale@lirmm.fr

 

PRESIDENT OF BOARD 
Yervant ZORIAN
Synopsys, Inc.  USA 
Tel. +1-650-584-7120 
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR 
Adit D. SINGH  
Auburn University - USA  
Tel.  +1-334-844-1847  
E-mail adsingh@eng.auburn.edu

TTTC 2ND VICE CHAIR 
Rohit KAPUR
 
Synopsys, Inc. 
USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE 
Chen-Huan CHIANG
Alcatel-Lucent - USA
E-mail chen-huan.chiang@alcatel-lucent.com

IEEE DESIGN & TEST EIC 
André IVANOV
U. of British Columbia Canada 
Tel. +1 
E-mail ivanov@ece.ubc.ca

TECHNICAL MEETINGS 
Chen-Huan CHIANG 
Alcatel-Lucent
 - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatel-lucent.com

TECHNICAL ACTIVITIES 
Matteo SONZA REORDA
Politecnico di Torino Italy
Tel.+39 090 7055
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC 
Kazumi HATAYAMA
Gumma University - Japan
Tel.+81-277-30-1111
E-mail k-hatayama@el.gunma-u.ac.jp

LATIN AMERICA 
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA 
André IVANOV 
University of British Columbia - Canada 
Tel. +1-604-822-6936 
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA 
Università di Bologna - Italy
Tel. +39-051-209-3038 
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.  USA 
Tel. +1-650-584-7120 
E-mail Yervant.Zorian@synopsys.com